A. C. Erdal
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1988–1988
Best venue rank
C
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1988 | ICCD | A global chip test implementation including built-in self-test. | A. C. Erdal, Pierre A. Uszynski |