| 2024 | DATE | An AI-Enabled Framework for Smart Semiconductor Manufacturing. | Khaled Sidahmed Sidahmed Alamin, Davide Appello, Alessandro Beghi, Nicola Dall'Ora, Fabio Depaoli, Santa Di Cataldo, Franco Fummi, Sebastiano Gaiardelli, Michele Lora, Enrico Macii, Alessio Mascolini, Daniele Pagano, Francesco Ponzio, Gian Antonio Susto, Sara Vinco |
| 2023 | FDL | VIR2EM: VIrtualization and Remotization for Resilient and Efficient Manufacturing: Project-Dissemination Paper. | Alessandro Beghi, Nicola Dall'Ora, Davide Dalle Pezze, Franco Fummi, Chiara Masiero, Stefano Spellini, Gian Antonio Susto, Francesco Tosoni |
| 2020 | WSC | Interpretable Anomaly Detection for Knowledge Discovery in Semiconductor Manufacturing. | Mattia Carletti, Marco Maggipinto, Alessandro Beghi, Gian Antonio Susto, Natalie Gentner, Yao Yang, Andreas Kyek |
| 2019 | INDIN | A Deep Learning-based Approach to Anomaly Detection with 2-Dimensional Data in Manufacturing. | Marco Maggipinto, Alessandro Beghi, Gian Antonio Susto |
| 2019 | SMC | Explainable Machine Learning in Industry 4.0: Evaluating Feature Importance in Anomaly Detection to Enable Root Cause Analysis. | Mattia Carletti, Chiara Masiero, Alessandro Beghi, Gian Antonio Susto |
| 2018 | ETFA | Local Principal Component Analysis for Fault Detection in Air-Condensed Water Chillers. | Francesco Simmini, Mirco Rampazzo, Alessandro Beghi, Fabio Peterle |
| 2016 | ETFA | Dealing with time-series data in Predictive Maintenance problems. | Gian Antonio Susto, Alessandro Beghi |
| 2014 | DSD | Enhancing the Simulation-Centric Design of Cyber-Physical and Multi-physics Systems through Co-simulation. | Alessandro Beghi, Fabio Marcuzzi, Mirco Rampazzo, Marco Virgulin |
| 2013 | ETFA | Prediction of integral type failures in semiconductor manufacturing through classification methods. | Gian Antonio Susto, Sen F. McLoone, Daniele Pagano, Andrea Schirru, Simone Pampuri, Alessandro Beghi |
| 2013 | SMC | A Real-Time Implementation of an MPC-Based Motion Cueing Strategy with Time-Varying Prediction. | Alessandro Beghi, Mattia Bruschetta, Fabio Maran |
| 2011 | ETFA | A Virtual Metrology system for predicting CVD thickness with equipment variables and qualitative clustering. | Gian Antonio Susto, Alessandro Beghi, Cristina De Luca |