Alexandre Derville
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2025–2025
Best venue rank
B
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2025 | IJCNN | DML Mask R-CNN: addressing Dependent Multi-Label defect detection with severity estimation in manufacturing. | Thomas Mignot, Franois Ponchon, Alexandre Derville, Stefan Duffner, Christophe Garcia |