Ali E. Kayaalp
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1989–1989
Best venue rank
A*
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1989 | CVPR | Scanning electron microscope based stereo analysis [for semiconductor IC inspection]. | Ali E. Kayaalp, A. Ravishankar Rao, Ramesh C. Jain |