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Andreas Kyek

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

3

Venues

1

Active years

2020–2021

Best venue rank

National

Where they publish

Papers

3 indexed papers, newest first.

YearVenueTitleAuthors
2021WSCA Scalable Deep Learning-Based Approach for Anomaly Detection in Semiconductor Manufacturing.Simone Tedesco, Gian Antonio Susto, Natalie Gentner, Andreas Kyek, Yao Yang
2020WSCInterpretable Anomaly Detection for Knowledge Discovery in Semiconductor Manufacturing.Mattia Carletti, Marco Maggipinto, Alessandro Beghi, Gian Antonio Susto, Natalie Gentner, Yao Yang, Andreas Kyek
2020WSCEnhancing Scalability of Virtual Metrology: A Deep Learning-Based Approach for Domain Adaptation.Natalie Gentner, Andreas Kyek, Yao Yang, Mattia Carletti, Gian Antonio Susto