Bill Sudyka
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2000–2000
Best venue rank
A*
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2000 | KDD | Mining IC test data to optimize VLSI testing. | Tony Fountain, Thomas G. Dietterich, Bill Sudyka |