C. Jung
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2006–2006
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2006 | DATE | Test and reliability challenges in automotive microelectronics. | Christian Sebeke, C. Jung, Klaus Harbich, S. Fuchs, J. Schwarz, Peter Ghner |