Christopher Henard
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
14
Venues
6
Active years
2013–2017
Best venue rank
A*
Where they publish
Papers
14 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2017 | ICST | Assessing and Improving the Mutation Testing Practice of PIT. | Thomas Laurent, Mike Papadakis, Marinos Kintis, Christopher Henard, Yves Le Traon, Anthony Ventresque |
| 2016 | ICSE | Comparing white-box and black-box test prioritization. | Christopher Henard, Mike Papadakis, Mark Harman, Yue Jia, Yves Le Traon |
| 2016 | ISSTA | PIT: a practical mutation testing tool for Java (demo). | Henry Coles, Thomas Laurent, Christopher Henard, Mike Papadakis, Anthony Ventresque |
| 2016 | ISSTA | Threats to the validity of mutation-based test assessment. | Mike Papadakis, Christopher Henard, Mark Harman, Yue Jia, Yves Le Traon |
| 2015 | ICSE | Combining Multi-Objective Search and Constraint Solving for Configuring Large Software Product Lines. | Christopher Henard, Mike Papadakis, Mark Harman, Yves Le Traon |
| 2015 | ICST | Flattening or not of the combinatorial interaction testing models? | Christopher Henard, Mike Papadakis, Yves Le Traon |
| 2014 | ICST | MutaLog: A Tool for Mutating Logic Formulas. | Christopher Henard, Mike Papadakis, Yves Le Traon |
| 2014 | ICST | Sampling Program Inputs with Mutation Analysis: Going Beyond Combinatorial Interaction Testing. | Mike Papadakis, Christopher Henard, Yves Le Traon |
| 2014 | SAC | Towards a language-independent approach for reverse-engineering of software product lines. | Tewfik Ziadi, Christopher Henard, Mike Papadakis, Mikal Ziane, Yves Le Traon |
| 2014 | SSBSE | Mutation-Based Generation of Software Product Line Test Configurations. | Christopher Henard, Mike Papadakis, Yves Le Traon |
| 2013 | ICSE | Towards automated testing and fixing of re-engineered feature models. | Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Yves Le Traon |
| 2013 | ICST | Assessing Software Product Line Testing Via Model-Based Mutation: An Application to Similarity Testing. | Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Yves Le Traon |
| 2013 | SPLC | Multi-objective test generation for software product lines. | Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Yves Le Traon |
| 2013 | SPLC | PLEDGE: a product line editor and test generation tool. | Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Yves Le Traon |