| 2020 | UAI | Model-Augmented Conditional Mutual Information Estimation for Feature Selection. | Alan Yang, AmirEmad Ghassami, Maxim Raginsky, Negar Kiyavash, Elyse Rosenbaum |
| 2019 | DATE | Guilty As Charged: Computational Reliability Threats Posed By Electrostatic Discharge-induced Soft Errors. | Keven Feng, Sandeep Vora, Rui Jiang, Elyse Rosenbaum, Shobha Vasudevan |
| 2005 | ISCAS | On-chip ESD protection for RF I/Os: devices, circuits and models. | Elyse Rosenbaum, Sami Hyvonen |
| 2004 | DAC | Noise characterization of static CMOS gates. | Rouwaida Kanj, Timothy Lehner, Bhavna Agrawal, Elyse Rosenbaum |
| 2002 | ICCAD | Comprehensive frequency-dependent substrate noise analysis using boundary element methods. | Hongmei Li, Jorge Carballido, Harry H. Yu, Vladimir I. Okhmatovski, Elyse Rosenbaum, Andreas C. Cangellaris |
| 2002 | ISCAS | A critical look at design guidelines for SOI logic gates. | Rouwaida Kanj, Elyse Rosenbaum |
| 1999 | DAC | Substrate Modeling and Lumped Substrate Resistance Extraction for CMOS ESD/Latchup Circuit Simulation. | Tong Li, Ching-Han Tsai, Elyse Rosenbaum, Sung-Mo Kang |
| 1996 | DAC | iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS VLSI Chips. | Yi-Kan Cheng, Chin-Chi Teng, Abhijit Dharchoudhury, Elyse Rosenbaum, Sung-Mo Kang |
| 1996 | DAC | Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects. | Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang |
| 1996 | DATE | ETS-A: A New Electrothermal Simulator for CMOS VLSI Circuits. | Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang |