| 2017 | IECON | Compact electro-thermal modeling of a SiC MOSFET power module under short-circuit conditions. | Lorenzo Ceccarelli, Paula Diaz Reigosa, Amir Sajjad Bahman, Francesco Iannuzzo, Frede Blaabjerg |
| 2017 | IECON | Separation test method for investigation of current density effects on bond wires of SiC power MOSFET modules. | Haoze Luo, Francesco Iannuzzo, Frede Blaabjerg, Wuhua Li, Xiangning He |
| 2017 | IECON | Active thermal control for reliability improvement of MOS-gated power devices. | Alessandro Soldati, Carlo Concari, Fabrizio Dossena, Davide Barater, Francesco Iannuzzo, Frede Blaabjerg |
| 2017 | IECON | Active thermal control by controlled shoot-through of power devices. | Alessandro Soldati, Francesco Iannuzzo, Frede Blaabjerg |
| 2014 | IECON | Investigation on the short-circuit behavior of an aged IGBT module through a 6 kA/1.1 kV non-destructive testing equipment. | Rui Wu, Liudmila Smirnova, Francesco Iannuzzo, Huai Wang, Frede Blaabjerg |
| 2013 | IECON | Catastrophic failure and fault-tolerant design of IGBT power electronic converters - an overview. | Rui Wu, Frede Blaabjerg, Huai Wang, Marco Liserre, Francesco Iannuzzo |