G. Van Brakel
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1995–1995
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1995 | DATE | Gate delay fault test generation for non-scan circuits. | G. Van Brakel, Uwe Glser, Hans G. Kerkhoff, Heinrich Theodor Vierhaus |