| 2026 | ICST | The Hidden Costs of Evaluating Automated CI Repair at SAP HANA. | Sumi Yun, Jingun Hong, Somin Kim, Hyunjoon Cho, Gabin An, Shin Yoo |
| 2025 | ICST | Evaluating Machine Learning-Based Test Case Prioritization in the Real World: An Experiment with SAP HANA. | Jeongki Son, Gabin An, Jingun Hong, Shin Yoo |
| 2024 | SSBSE | Iterative Refactoring of Real-World Open-Source Programs with Large Language Models. | Jinsu Choi, Gabin An, Shin Yoo |
| 2023 | ICSE | Fonte: Finding Bug Inducing Commits from Failures. | Gabin An, Jingun Hong, Naryeong Kim, Shin Yoo |
| 2022 | ICSE | Automatically Identifying Shared Root Causes of Test Breakages in SAP HANA. | Gabin An, Juyeon Yoon, Jeongju Sohn, Jingun Hong, Dongwon Hwang, Shin Yoo |
| 2022 | ISSTA | FDG: a precise measurement of fault diagnosability gain of test cases. | Gabin An, Shin Yoo |
| 2021 | ICST | Assisting Bug Report Assignment Using Automated Fault Localisation: An Industrial Case Study. | Jeongju Sohn, Gabin An, Jingun Hong, Dongwon Hwang, Shin Yoo |
| 2021 | ISSRE | Ahead of Time Mutation Based Fault Localisation using Statistical Inference. | Jinhan Kim, Gabin An, Robert Feldt, Shin Yoo |
| 2021 | SSBSE | Searching for Multi-fault Programs in Defects4J. | Gabin An, Juyeon Yoon, Shin Yoo |
| 2018 | ICSE | Comparing line and AST granularity level for program repair using PyGGI. | Gabin An, Jinhan Kim, Shin Yoo |