Guy Imbert
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2017–2017
Best venue rank
C
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2017 | IECON | Simulation and analysis of DC and RF performances degradation of NMOS transistors under hot carrier injection mechanism. | Insaf Lahbib, Aziz Doukkali, Patrick Martin, Philippe Descamps, Guy Imbert |