Heechan Yang
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2026–2026
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2026 | ICST | Industrial Application of Deep Learning based Fault Localization with Mutation Features. | Heechan Yang, Ahcheong Lee, Kyutae Cho, Yunsam Kim |