| 2019 | DATE | Hot Spot Identification and System Parameterized Thermal Modeling for Multi-Core Processors Through Infrared Thermal Imaging. | Sheriff Sadiqbatcha, Hengyang Zhao, Hussam Amrouch, Jrg Henkel, Sheldon X.-D. Tan |
| 2018 | ASPDAC | Accelerating electromigration aging for fast failure detection for nanometer ICs. | Zeyu Sun, Sheriff Sadiqbatcha, Hengyang Zhao, Sheldon X.-D. Tan |
| 2018 | ASPDAC | Electromigration-lifetime constrained power grid optimization considering multi-segment interconnect wires. | Han Zhou, Yijing Sun, Zeyu Sun, Hengyang Zhao, Sheldon X.-D. Tan |
| 2018 | ICCAD | Multi-physics-based FEM analysis for post-voiding analysis of electromigration failure effects. | Hengyang Zhao, Sheldon X.-D. Tan |
| 2017 | DATE | Recovery-aware proactive TSV repair for electromigration in 3D ICs. | Shengcheng Wang, Hengyang Zhao, Sheldon X.-D. Tan, Mehdi Baradaran Tahoori |
| 2016 | ASPDAC | Thermal modeling for energy-efficient smart building with advanced overfitting mitigation technique. | Wandi Liu, Hai Wang, Hengyang Zhao, Shujuan Wang, Hai-Bao Chen, Yuzhuo Fu, Jian Ma, Xin Li, Sheldon X.-D. Tan |
| 2016 | DAC | Invited - Cross-layer modeling and optimization for electromigration induced reliability. | Taeyoung Kim, Zeyu Sun, Chase Cook, Hengyang Zhao, Ruiwen Li, Daniel Wong, Sheldon X.-D. Tan |
| 2016 | ISCAS | Learning-based occupancy behavior detection for smart buildings. | Hengyang Zhao, Zhongdong Qi, Shujuan Wang, Kambiz Vafai, Hai Wang, Hai-Bao Chen, Sheldon X.-D. Tan |
| 2015 | ICCAD | Learning Based Compact Thermal Modeling for Energy-Efficient Smart Building Management: (invited). | Hengyang Zhao, Daniel Quach, Shujuan Wang, Hai Wang, Hai-Bao Chen, Xin Li, Sheldon X.-D. Tan |