Israel Nadler-Niv
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1988–1988
Best venue rank
National
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1988 | MVA | Quality Estimation of SEM Wafer Images. | Eyal Bartfeld, Israel Nadler-Niv |