Ives Rey-Otero
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
2014–2015
Best venue rank
B
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2015 | ICIP | Comparing feature detectors: A bias in the repeatability criteria. | Ives Rey-Otero, Mauricio Delbracio, Jean-Michel Morel |
| 2014 | ICIP | An analysis of scale-space sampling in SIFT. | Ives Rey-Otero, Jean-Michel Morel, Mauricio Delbracio |