J. Mitsuishi
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1997–1997
Best venue rank
B
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1997 | ICONIP | Reduction of the Test Time for Mass Produced LSI Devices by Genetic Algorithms. | T. Iwamoto, S. Kobashi, Narumi Sakashita, J. Mitsuishi, Ken-ichi Tanaka, Kazuo Kyuma |