J. Schwarz
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
1976–2006
Best venue rank
A*
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2006 | DATE | Test and reliability challenges in automotive microelectronics. | Christian Sebeke, C. Jung, Klaus Harbich, S. Fuchs, J. Schwarz, Peter Ghner |
| 1976 | ICALP | Event Based Reasoning - A System for Proving Correct Termination of Programs. | J. Schwarz |