| 2019 | CoDIT | Evaluation of Alarm System Performance and Management in Semiconductor Manufacturing. | Mohammed Al-Kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton |
| 2018 | WSC | Improving Business Process in semiconductor manufacturing by Discovering Business Rules. | Abdelhak Khemiri, Mamar El-Amine Hamri, Claudia S. Frydman, Jacques Pinaton |
| 2018 | WSC | A Bayesian indicator for Run-to-Run Performance Assessment using Industrail Risk. | Taki Eddine Korabi, Guillaume Graton, El Mostafa El Adel, Mustapha Ouladsine, Jacques Pinaton |
| 2018 | WSC | A Study on the Integration of Complex Machines in Complex Job shop Scheduling. | Karim Tamssaouet, Stphane Dauzre-Prs, Claude Yugma, Sebastian Knopp, Jacques Pinaton |
| 2018 | WSC | Virtual Metrology Modeling based on Gaussian Bayesian Network. | Wei-Ting Yang, Jakey Blue, Agns Roussy, Marco S. Reis, Jacques Pinaton |
| 2017 | WSC | A Simulation-Based Approach for an Effective AMHS Design in a Legacy Semiconductor Manufacturing Facility. | Ali Ben-Salem, Claude Yugma, Emmanuel Troncet, Jacques Pinaton |
| 2016 | WSC | Run-to-Run sensor variation monitoring for process fault diagnosis in semiconductor manufacturing. | Jakey Blue, Agns Roussy, Jacques Pinaton |
| 2015 | WSC | Simulation model to control risk levels on process equipment through metrology in semiconductor manufacturing. | Alejandro Sendn, Stphane Dauzre-Prs, Jacques Pinaton |
| 2013 | CSCWD | A semantic support to improve the collaborative control of manufacturing processes in industries. | Sara Bouzid, Corine Cauvet, Claudia S. Frydman, Jacques Pinaton |
| 2013 | WSC | Skipping algorithms for defect inspection using a dynamic control strategy in semiconductor manufacturing. | Gloria Luz Rodrguez-Verjn, Stphane Dauzre-Prs, Sylvain Housseman, Jacques Pinaton |
| 2012 | WSC | A mathematical model for estimating defect inspection capacity with a dynamic control strategy. | Gloria Rodrguez-Verjn, Stphane Dauzre-Prs, Jacques Pinaton |
| 2011 | AICCSA | New methodology for modeling large scale manufacturing process: Using process mining methods and experts' knowledge. | Pamela Viale, Claudia S. Frydman, Jacques Pinaton |
| 2011 | WSC | Impact of control plan design on tool risk management: a simulation study in semiconductor manufacturing. | Gloria Rodrguez-Verjn, Stphane Dauzre-Prs, Jacques Pinaton |
| 2011 | WSC | A smart sampling scheduling and skipping simulator and its evaluation on real data sets. | Claude Yugma, Stphane Dauzre-Prs, Jean-Loup Rouveyrol, Philippe Vialletelle, Jacques Pinaton, Christophe Relliaud |
| 2010 | ICSoft | Discovering Large Scale Manufacturing Process Models from Timed Data - Application to STMicroelectronics' Production Processes. | Pamela Viale, Nabil Benayadi, Marc Le Goc, Jacques Pinaton |