Jakey Blue
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
4
Venues
2
Active years
2016–2018
Best venue rank
National
Where they publish
Papers
4 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2018 | WSC | The Detection and the control of Machine/Chamber Mismatching in Semiconductormanufacturing. | Aabir Chouichi, Jakey Blue, Claude Yugma, Franois Pasqualini |
| 2018 | WSC | Virtual Metrology Modeling based on Gaussian Bayesian Network. | Wei-Ting Yang, Jakey Blue, Agns Roussy, Marco S. Reis, Jacques Pinaton |
| 2016 | ICMLA | Equipment Condition Diagnosis and Fault Fingerprint Extraction in Semiconductor Manufacturing. | Hamideh Rostami, Jakey Blue, Claude Yugma |
| 2016 | WSC | Run-to-Run sensor variation monitoring for process fault diagnosis in semiconductor manufacturing. | Jakey Blue, Agns Roussy, Jacques Pinaton |