Ji-Wei Li
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2020–2020
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2020 | DATE | Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis. | Ken Chau-Cheung Cheng, Katherine Shu-Min Li, Andrew Yi-Ann Huang, Ji-Wei Li, Leon Li-Yang Chen, Nova Cheng-Yen Tsai, Sying-Jyan Wang, Chen-Shiun Lee, Leon Chou, Peter Yi-Yu Liao, Hsing-Chung Liang, Jwu E. Chen |