Jianqiang Nie
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2020–2020
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2020 | DATE | Valid Window: A New Metric to Measure the Reliability of NAND Flash Memory. | Min Ye, Qiao Li, Jianqiang Nie, Tei-Wei Kuo, Chun Jason Xue |