Jim Aarestad
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
2011–2011
Best venue rank
A*
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2011 | DAC | Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect. | Jim Aarestad, Charles Lamech, Jim Plusquellic, Dhruva Acharyya, Kanak Agarwal |
| 2011 | ICCAD | REBEL and TDC: Two embedded test structures for on-chip measurements of within-die path delay variations. | Charles Lamech, Jim Aarestad, Jim Plusquellic, Reza M. Rad, Kanak Agarwal |