Jin Nagai
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2001–2001
Best venue rank
B
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2001 | ASPDAC | Test circuits for substrate noise evaluation in CMOS digital ICs. | Makoto Nagata, Takafumi Ohmoto, Jin Nagai, Takashi Morie, Atsushi Iwata |