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Jir Zahrdka

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

1

Venues

1

Active years

2005–2005

Best venue rank

Unranked

Where they publish

Papers

1 indexed papers, newest first.

YearVenueTitleAuthors
2005EDCCCOMPAS - Compressed Test Pattern Sequencer for Scan Based Circuits.Ondrej Novk, Jir Zahrdka, Zdenek Plva