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Jonathan P. Chapman

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

1

Venues

1

Active years

2016–2016

Best venue rank

B

Where they publish

Papers

1 indexed papers, newest first.

YearVenueTitleAuthors
2016LCNKey Factors in Industrial Control System Security.Jonathan P. Chapman, Simon Ofner, Piotr Pauksztelo