Jonathan R. Carter
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2005–2005
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2005 | DATE | Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown. | Jonathan R. Carter, Sule Ozev, Daniel J. Sorin |