Jongchul Shin
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
1999–1999
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1999 | DATE | At-Speed Boundary-Scan Interconnect Testing in a Board with Multiple System Clocks. | Jongchul Shin, Hyunjin Kim, Sungho Kang |
| 1999 | ICCD | An Efficient Interconnect Test Using BIST Module in a Boundary-Scan Environment. | Hyunjin Kim, Jongchul Shin, Sungho Kang |