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Julia Mhrwald

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

1

Venues

1

Active years

2013–2013

Best venue rank

C

Where they publish

Papers

1 indexed papers, newest first.

YearVenueTitleAuthors
2013ICMLAVirtual Metrology in Semiconductor Manufacturing by Means of Predictive Machine Learning Models.Benjamin Lenz, Bernd Barak, Julia Mhrwald, Carolin Leicht