Julio Brandelero
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2013–2013
Best venue rank
C
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2013 | IECON | A non-intrusive method for measuring switching losses of GaN power transistors. | Julio Brandelero, Bernardo Cougo, Thierry Meynard, Nicolas Videau |