| 2019 | DDECS | High side power MOSFET switch driver for a low-power AC/DC converter. | Miroslav Potocn, Juraj Brenkus, Viera Stopjakov |
| 2016 | DDECS | Low-voltage bulk-driven variable gain amplifier in 130 nm CMOS technology. | Daniel Arbet, Martin Kovc, Luks Nagy, Viera Stopjakov, Juraj Brenkus |
| 2016 | DDECS | Impedance calculation based method for AC fault analysis of mixed-signal circuits. | Juraj Brenkus, Viera Stopjakov, Luks Nagy, Daniel Arbet |
| 2014 | DDECS | A novel impedance calculation method and its time efficiency evaluation. | Juraj Brenkus, Viera Stopjakov, Daniel Arbet, Gbor Gyepes, Libor Majer |
| 2013 | DDECS | Numerical method for DC fault analysis simplification and simulation time reduction. | Juraj Brenkus, Viera Stopjakov, Gbor Gyepes |
| 2012 | DDECS | OBIST strategy versus parametric test - Efficiency in covering catastrophic faults in active analog filters. | Daniel Arbet, Gbor Gyepes, Juraj Brenkus, Viera Stopjakov |
| 2012 | DDECS | Application of IDDT test towards increasing SRAM reliability in nanometer technologies. | Gbor Gyepes, Daniel Arbet, Juraj Brenkus, Viera Stopjakov |
| 2011 | DDECS | Increasing the efficiency of analog OBIST using on-chip compensation of technology variations. | Daniel Arbet, Juraj Brenkus, Gbor Gyepes, Viera Stopjakov |
| 2011 | DDECS | Comparison of iddt test efficiency in covering opens in SRAMs realised in two different technologies. | Gbor Gyepes, Juraj Brenkus, Daniel Arbet, Viera Stopjakov |
| 2009 | DDECS | Comparison of different test strategies on a mixed-signal circuit. | Juraj Brenkus, Viera Stopjakov, Ronny Vanhooren, Anton Chichkov |
| 2008 | DDECS | Experimental Analog Circuit for Parametric Test Methods Efficiency Evaluation. | Juraj Brenkus, Viera Stopjakov, Jozef Mihlov |