Keith Kasprak
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2017–2017
Best venue rank
A*
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2017 | DAC | On Characterizing Near-Threshold SRAM Failures in FinFET Technology. | Shrikanth Ganapathy, John Kalamatianos, Keith Kasprak, Steven Raasch |