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Kennosuke Fukami

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

1

Venues

1

Active years

1995–1995

Best venue rank

B

Where they publish

Papers

1 indexed papers, newest first.

YearVenueTitleAuthors
1995ASPDACA tool for measuring quality of test pattern for LSIs' functional design.Takashi Aoki, Tomoji Toriyama, Kenji Ishikawa, Kennosuke Fukami