Koji Banno
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2014–2014
Best venue rank
B
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2014 | ASPDAC | A volume diagnosis method for identifying systematic faults in lower-yield wafer occurring during mass production. | Tsutomu Ishida, Izumi Nitta, Koji Banno, Yuzi Kanazawa |