Kouhei Ohtani
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2003–2003
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2003 | DATE | A Method of Test Generation fo Path Delay Faults Using Stuck-at Fault Test Generation Algorithms. | Satoshi Ohtake, Kouhei Ohtani, Hideo Fujiwara |