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L. J. Vidunas

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

2

Venues

1

Active years

1977–1984

Best venue rank

A*

Where they publish

Papers

2 indexed papers, newest first.

YearVenueTitleAuthors
1984DACAn automated system for testing LSI memory chips.H. D. Schnurmann, L. J. Vidunas, R. M. Peters
1977DACDelay test generation.E. R. Hsieh, Robert A. Rasmussen, L. J. Vidunas, W. T. Davis