L. R. Williams
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1972–1972
Best venue rank
A*
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1972 | DAC | Fault-test analysis techniques based on logic simulation. | Ernst G. Ulrich, Thomas E. Baker, L. R. Williams |