M. Kley
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1994–1994
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1994 | ICCAD | Test generation for bridging faults in CMOS ICs based on current monitoring versus signal propagation. | Uwe Glser, Heinrich Theodor Vierhaus, M. Kley, A. Wiederhold |