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Marcin J. Beresinski

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

1

Venues

1

Active years

2008–2008

Best venue rank

C

Where they publish

Papers

1 indexed papers, newest first.

YearVenueTitleAuthors
2008DDECSBuilt-In Current Monitor for IDDQ Testing in CMOS 90 nm Technology.Marcin J. Beresinski, Tomasz Borejko, Witold A. Pleskacz, Viera Stopjakov