Mattias Van Dael
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2015–2015
Best venue rank
B
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2015 | ICIP | Neural netwok based X-ray tomography for fast inspection of apples on a conveyor belt system. | Eline Janssens, Jan De Beenhouwer, Mattias Van Dael, Pieter Verboven, Bart M. Nicola, Jan Sijbers |