Mitsukuni Tsuboya
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1974–1974
Best venue rank
A*
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1974 | DAC | A new heuristic test generation algorithm for sequential circuits. | Toshihiro Arima, Mitsukuni Tsuboya, Goro Amamiya, Jiro Okuda |