N. B. Bish
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2000–2000
Best venue rank
B
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2000 | KES | Condition diagnostics of a physical breakdown mechanism in high voltage dielectrics utilising 'AI' evaluation techniques. | N. B. Bish, Peter A. Howson, Robert J. Howlett |