Naveen John Punnoose
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
2018–2021
Best venue rank
C
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2021 | IECON | Data-driven Quality Estimation for Production Processes with Lot-level Quality Control. | Naveen John Punnoose, Prahlad Vadakkepat, Ai Poh Loh, Edward Kien Yee Yapp |
| 2018 | ETFA | An Ensemble of fuzzy Class-Biased Networks for Product Quality Estimation. | Shanmugasivam Pillai, Naveen John Punnoose, Prahlad Vadakkepat, Ai Poh Loh, Kee Jin Lee |