Navid Rasekh
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2020–2020
Best venue rank
C
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2020 | IECON | Triple Pulse Test (TPT) for Characterizing Power Loss in Magnetic Components in Analogous to Double Pulse Test (DPT) for Power Electronics Devices. | Jun Wang, Xibo Yuan, Navid Rasekh |