Paolo Matrella
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1996–1996
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1996 | ISSRE | Sensitivity of reliability growth models to operational profile errors. | Adalberto Nobiato Crespo, Paolo Matrella, Alberto Pasquini |