Peter Ehses
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2015–2015
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2015 | DATE | Retention time measurements and modelling of bit error rates of WIDE I/O DRAM in MPSoCs. | Christian Weis, Matthias Jung, Peter Ehses, Cristiano Santos, Pascal Vivet, Sven Goossens, Martijn Koedam, Norbert Wehn |