Piet Dewaele
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
3
Venues
3
Active years
1988–1999
Best venue rank
A
Where they publish
Papers
3 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1999 | MICCAI | Active Shape Model-Based Segmentation of Digital X-ray Images. | Gert Behiels, Dirk Vandermeulen, Frederik Maes, Paul Suetens, Piet Dewaele |
| 1988 | ICPR | Texture inspection with self-adaptive convolution filters. | Piet Dewaele, Luc Van Gool, Patrick Wambacq, Andr Oosterlinck |
| 1988 | MVA | Some Visual Inspection Problems in the Belgian Industry (Invited). | Patrick Wambacq, Piet Dewaele, Rudi Bartels, Johan Vandeneede, Dirk Van Den Oudenhoven, Andr Oosterlinck |