Pin Rajbondit
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2025–2025
Best venue rank
C
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2025 | IECON | Construction of Fault Lexicon for Electrical Test Systems Based on Knowledge Graphs. | Yanmin Wang, Jiaming Wang, Pin Rajbondit, Zhihong Zhang, Dundun Liu |