| 2025 | ICCAD | FabThink: A Wafer Analysis Multimodal LLM via Chain-of-Thought-Driven Retrieval Augmentation. | Yuqi Jiang, Qian Jin, Xudong Lu, Jinyuan Deng, Hao Geng, Hanming Wu, Qi Sun, Cheng Zhuo |
| 2025 | ICCAD | Invited Paper: Unitho: A Unified Multi-Task Framework for Computational Lithography. | Qian Jin, Yumeng Liu, Yuqi Jiang, Qi Sun, Cheng Zhuo |
| 2024 | DAC | Minimizing Labeling, Maximizing Performance: A Novel Approach to Nanoscale Scanning Electron Microscope (SEM) Defect Segmentation. | Yibo Qiao, Weiping Xie, Shunyuan Lou, Qian Jin, Lichao Zeng, Yining Chen, Qi Sun, Cheng Zhuo |
| 2024 | ICCAD | FabGPT: An Efficient Large Multimodal Model for Complex Wafer Defect Knowledge Queries. | Yuqi Jiang, Xudong Lu, Qian Jin, Qi Sun, Hanming Wu, Cheng Zhuo |
| 2024 | ICCAD | SEM-CLIP: Precise Few-Shot Learning for Nanoscale Defect Detection in Scanning Electron Microscope Image. | Qian Jin, Yuqi Jiang, Xudong Lu, Yumeng Liu, Yining Chen, Dawei Gao, Qi Sun, Cheng Zhuo |
| 2013 | IECON | Switch-linear hybrid envelope-tracking power supply with multilevel structure. | Qian Jin, Xinbo Ruan |